TERMIUM Plus®

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FOCUSED ION BEAM [1 record]

Record 1 2006-06-29

English

Subject field(s)
  • Radiological Physics (Theory and Application)
CONT

A Focused Ion Beam (FIB) makes use of Ga-ions to remove material with a very high spatial precision. In this way cross-sections can be made on a specific location. ... When both Ga-ions and certain gases are applied, it is also possible to deposit material. Therefore, the FIB can be used as a multifunctional tool in a broad range of applications.

OBS

A Focussed Ion Beam (FIB) is in many ways similar to a SEM (Scanning Electron Microscope). The main difference is that ions are used, instead of electrons.

OBS

Ga-ion: Gallium ion.

Key term(s)
  • focused ion beam

French

Domaine(s)
  • Physique radiologique et applications
CONT

Le projet NANOFIB met au point une technique de faisceau ionique focalisé. Le diamètre du faisceau est de l'ordre de quelques nanomètres seulement, soit quelques dizaines de diamètres atomiques. [...] Ce procédé de «nanomanipulation», d'une importance cruciale pour l'avenir de la nanofabrication, a pour but de structurer les matériaux à des échelles extrêmement petites.

OBS

NANOFIB: Projet européen de recherche sur les faisceaux ioniques focalisés.

Spanish

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