TERMIUM Plus®

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DEFAILLANCE CONTACT [1 record]

Record 1 2009-06-19

English

Subject field(s)
  • Electrical Relays
CONT

Contact failure occurs when the closed resistance is too high or open resistance too low.

CONT

When a test is conducted on a semiconductor wafer having such a high-load electrode by adopting the contact board of the first embodiment, there is a risk that impact on the high-load electrode and a contact failure between other electrode and a via of the contact board might occur.

French

Domaine(s)
  • Relais (Distribution électrique)

Spanish

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