TERMIUM Plus^®

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In scanning electron microscopy(SEM), a fine probe of electrons with energies typically up to 40 keV [kiloelectron volts] is focused on a specimen, and scanned along a pattern of parallel lines. Various signals are generated as a result of the impact of the incident electrons, which are collected to form an image or to analyse the sample surface. These are mainly secondary electrons, with energies of a few tens of eV [electron volts], high-energy electrons backscattered from the primary beam and characteristic X-rays.  5, fiche 1, Anglais, - scanning%20electron%20microscopy

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Microscopie électronique à balayage. Les microscopes électroniques à balayage (MEB) utilisent un faisceau d'électrons balayés hautement énergétique pour examiner la surface d'un échantillon.  6, fiche 1, Français, - microscopie%20%C3%A0%20balayage

Fiche 1,  Justifications,  Espagnol

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Técnica [que] se utiliza para la observación y análisis de superficies suministrando información de relieve, textura, tamaño y forma de grano y composición química [...] de muestras biológicas y minerales.  1, fiche 1, Espagnol, - microscop%C3%ADa%20electr%C3%B3nica%20de%20barrido

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SEM por sus siglas en inglés.  2, fiche 1, Espagnol, - microscop%C3%ADa%20electr%C3%B3nica%20de%20barrido

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Scanning transmission electron microscopy(STEM) combines the principles of transmission electron microscopy and scanning electron microscopy and can be performed on either type of instrument. Like TEM [transmission electron microscopy], STEM requires very thin samples and looks primarily at beam electrons transmitted by the sample. One of its principal advantages over TEM is in enabling the use of other signals that cannot be spatially correlated in TEM, including secondary electrons, scattered beam electrons, characteristic X-rays, and electron energy loss. Like SEM [scanning electron microscopy], the STEM technique scans a very finely focused beam of electrons across the sample in a raster pattern. Interactions between the beam electrons and sample atoms generate a serial signal stream, which is correlated with beam position to build a virtual image in which the signal level at any location in the sample is represented by the gray level at the corresponding location in the image. Its primary advantage over conventional SEM imaging is the improvement in spatial resolution.  3, fiche 2, Anglais, - scanning%20transmission%20electron%20microscopy

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Caractérisation des nanomatériaux par microscopie électronique à transmission et à balayage : résolution, analyse X, diffraction électronique, topographie et cartographie.  4, fiche 2, Français, - microscopie%20%C3%A9lectronique%20%C3%A0%20transmission%20et%20%C3%A0%20balayage

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El grupo de investigación [...] ha desarrollado un nuevo método de fabricación de nanoagujas localizadas en el interior de muestras de distintos materiales, que presentan un amplio rango de aplicaciones, como la preparación de muestras para análisis por microscopía electrónica de transmisión (TEM) y transmisión-barrido (STEM), para técnicas de microscopía óptica de barrido de campo cercano, tomografía electrónica y microscopía de sonda atómica.  2, fiche 2, Espagnol, - microscop%C3%ADa%20electr%C3%B3nica%20de%20transmisi%C3%B3n%20y%20barrido

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STEM: por su sigla en inglés (scanning transmission electron microscopy).  3, fiche 2, Espagnol, - microscop%C3%ADa%20electr%C3%B3nica%20de%20transmisi%C3%B3n%20y%20barrido

Fiche 3,  Justifications,  Anglais

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The scintillator-photomultiplier detector applied especially in scanning electron microscopy equipment.  2, fiche 3, Anglais, - Everhart%2DThornley%20detector

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Electron beam lithography requires a flat sample close to the objective lens, making secondary electron imaging difficult with an ordinary Everhart-Thornley detector(a scintillator-photomultiplier in the chamber). A few high end SEMs are equipped with a detector above the objective lens or can be equipped with a microchannel plate on the pole-piece. These types of detectors are a great advantage for lithography since they alloy the operator to decrease the working distance, and thus the spot size, while keeping the sample flat and in focus.  3, fiche 3, Anglais, - Everhart%2DThornley%20detector

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Fiche 4,  Justifications,  Anglais

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Any technique in which the specimen is bombarded by a focused beam of(primary) ions(diameter less than 10 µm) and the(secondary) ions ejected from the specimen are detected after passage through a mass spectrometer.  1, fiche 4, Anglais, - ion%20probe%20microanalysis

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Technique qui permet de détecter les ions secondaires éjectés d'un échantillon après leur passage dans un spectromètre de masse, suite au bombardement de l'échantillon par faisceau focalisé d'ions primaires (de diamètre inférieur à 10 µm).  2, fiche 4, Français, - microanalyse%20par%20sonde%20ionique

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microanalyse : Cette graphie, puisée des Rectifications de l'orthographe recommandées par le Conseil supérieur de la langue française, est attestée dans le Petit Robert (2004).  3, fiche 4, Français, - microanalyse%20par%20sonde%20ionique

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Fiche 5,  Justifications,  Anglais

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When an electron beam strikes the surface of [an] object, secondary electrons are emitted from the object. The secondary electrons are collected by a detector, known as a secondary emission detector(SED). The detected secondary emission is then coordinated with the excitation signals applied to the electron beam to extract an image of the object.  1, fiche 5, Anglais, - secondary%20emission%20detector

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Deux méthodes de détection ont été employées : - L'émission secondaire d'électrons par les neutres rapides dans un détecteur à émission secondaire-scintillation. Ce procédé ne permet pas l'analyse des particules et l'effet photoélectrique en limite l'utilisation. - L'ionisation des neutres rapides par une cellule à gaz (10-2 torr d'hélium), suivie de la détection des ions par un détecteur à émission secondaire-scintillation. L'analyse des particules est alors possible par différentes méthodes : déviation dans un champ électrique ou magnétique, temps de vol.  1, fiche 5, Français, - d%C3%A9tecteur%20%C3%A0%20%C3%A9mission%20secondaire

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Fiche 6,  Justifications,  Anglais

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During writing, the pattern of photoelectrons generated at the photocathode by the input light is imaged onto the target as a halftone potential pattern generated by secondary electrons. Scanning of the target surface by the reading beam may be accomplished either during writing or as a later step. As in other vidicon tubes, capacitive discharge of the target to cathode potential in reading automatically erases the target and leaves it prepared for a new image.  1, fiche 6, Anglais, - sec%20vidicon%20tube

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The machine that imparts the reciprocating motion to a string of sucker rods extending to the positive-displacement pump at the bottom of a well ...  2, fiche 7, Anglais, - pumping%20unit

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Pumping unit. Relatively few oil wells flow from natural pressures. Most require secondary means of removing the reservoir product. The most common of several methods is the pumping unit. A walking beam is operated like a seesaw, raising and lowering a plunger-type pump set near the bottom of the hole.  3, fiche 7, Anglais, - pumping%20unit

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(pour un seul puits).  2, fiche 7, Français, - unit%C3%A9%20de%20pompage

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Fiche 8,  Justifications,  Anglais

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Measurement of Stopping Power of MeV Heavy Ions Using Secondary Ion Beam Technique.  1, fiche 8, Anglais, - secondary%20ion%20beam%20technique

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[...] «... le développement continu et les applications des techniques de faisceaux à ions secondaires amèneront, dans la prochaine décennie, les plus stimulants résultats de l'astrophysique expérimentale...»  1, fiche 8, Français, - technique%20des%20faisceaux%20%C3%A0%20ions%20secondaires

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its optical system consists of a 50 mm primary objective lens, a spherical field mirror, relay lenses, a proprietary, gyroscope-mounted prism, secondary objective lenses, a beam splitter assembly, and the two eye lenses.  1, fiche 9, Anglais, - stabilized%20image%20binocular

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for use on moving platforms causing vibrations.  1, fiche 9, Anglais, - stabilized%20image%20binocular

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sorte de longue-vue composée essentiellement d'un objectif, d'un miroir concave, d'un prisme qui corrige les vibrations à l'aide d'un gyroscope et d'un dispositif de vision binoculaire.  1, fiche 9, Français, - lunette%20gyroscopique%20binoculaire

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Fiche 10,  Justifications,  Anglais

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Specimen images in scanning Auger microprobes are usually obtained from measurements of the specimen current or from secondary electrons during beam rastering, as such instruments are not usually equipped with suitable detectors for backscattered or other imaging.  1, fiche 10, Anglais, - scanning%20Auger%20microprobe

Fiche 10,  Justifications,  Français

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La tension (...) peut être déterminée expérimentalement par l'image obtenue en utilisant le courant d'émission que ce soit dans le microscope électronique à balayage ou dans le microspectromètre Auger à balayage.  1, fiche 10, Français, - microspectrom%C3%A8tre%20Auger%20%C3%A0%20balayage

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