TERMIUM Plus^®

Fiche 1,  Justifications,  Anglais

Record number: 1, Textual support number: 1 CONT

wafer prober. "Cascade Microtech is the acknowledged technology leader for wafer parametric measurement. By combining Cascade's low-noise technology and our advanced production probing capabilities, the EG5300e is unmatched in its ability to make the in-line parametric wafer measurements critical for validating the latest die fabrication processes during production. "  1, fiche 1, Anglais, - wafer%20prober

Fiche 1,  Justifications,  Français

Fiche 1,  Justifications,  Espagnol

Fiche 2,  Justifications,  Anglais

Record number: 2, Textual support number: 1 OBS

Because medium-scale integration(MSI) and large-scale integration(LSI) generally imply digital integrated circuits(ICS), equipment intended to test LSI/MSI devices usually comprises a digital test system. Although manually operated benchtop units are available to test digital logic in a production environment, automated test systems are dictated. Thus, in general, LSI/MSI testers are automated, programmable systems that provide sophisticated test patterns at high repetition rates(usually, rated device operating frequency), with precise edge timing and control of all test parameters. Employed primarily for testing at wafer probe and for final package test(interfaced to a wafer prober or a high-speed, sort devices into predetermined categories based upon test performance, and reject defective devices. A current trend-particularly for semiconductor memories-is to integrate test systems with burn-in systems.  1, fiche 2, Anglais, - LSI%2FMSI%20tester

Fiche 2,  Justifications,  Français

Record number: 2, Textual support number: 1 OBS

LSI signifie «intégration à grande échelle» et MSI «intégration à moyenne échelle.»  1, fiche 2, Français, - appareil%20de%20contr%C3%B4le%20LSI%2FMSI

Fiche 2,  Justifications,  Espagnol