TERMIUM Plus^®

Fiche 1,  Justifications,  Anglais

Record number: 1, Textual support number: 1 CONT

DELTA's automatic wafer tester. Wafers with microsystems are tested to sort out bad chips before encapsulation. The testing of microsystems is developed based on DELTA's long experience in testing of ICs(integrated circuits). The test can be purely electrical or(soon) with non-electrical stimuli and detection.  2, fiche 1, Anglais, - wafer%20tester

Fiche 1,  Justifications,  Français

Record number: 1, Textual support number: 1 DEF

Appareil généralement piloté par ordinateur et servant à vérifier le bon fonctionnement et les caractéristiques des circuits intégrés.  2, fiche 1, Français, - testeur%20de%20tranches

Fiche 1,  Justifications,  Espagnol

Fiche 2,  Justifications,  Anglais

Record number: 2, Textual support number: 1 CONT

Traditionally impurities were diffused into a wafer through a masking layer in a diffusion furnace. Today impurities are increasingly being implanted into a wafer structure through a process called ion implantation. A diffusion depth tester is used to determine to what depth these diffused impurities have penetrated into the wafer.  1, fiche 2, Anglais, - diffusion%20depth%20tester

Fiche 2,  Justifications,  Français

Fiche 2,  Justifications,  Espagnol

Fiche 3,  Justifications,  Anglais

Record number: 3, Textual support number: 1 CONT

Taper test equipment is used to test one aspect of the dimensional integrity of wafers. The apparatus can be part of a complete wafer test system, or it can be an individual piece of test equipment. Taper results when the two faces of the wafer under test are not parallel. The taper tester, as the name suggests, tests wafers to ensure that taper is not present before they undergo further processing.  1, fiche 3, Anglais, - taper%20test%20equipment

Fiche 3,  Justifications,  Français

Fiche 3,  Justifications,  Espagnol