TERMIUM Plus^®

Fiche 1,  Justifications,  Anglais

Record number: 1, Textual support number: 1 DEF

An item of electronic test equipment that is capable of displaying the logic state—true(logic 1), false(logic 0), or undefined—of a digital signal applied to its input probe.  2, fiche 1, Anglais, - logic%20probe

Record number: 1, Textual support number: 1 OBS

[The logic probe] is generally used to check the operation of individual devices within a digital logic circuit.  2, fiche 1, Anglais, - logic%20probe

Record number: 1, Textual support number: 2 OBS

logic probe : term officially approved by the Lexicon Project Committee(New Brunswick).  3, fiche 1, Anglais, - logic%20probe

Fiche 1,  Justifications,  Français

Record number: 1, Textual support number: 1 DEF

Sonde conçue pour tester rapidement les niveaux logiques dans les systèmes de circuits intégrés.  2, fiche 1, Français, - sonde%20logique

Record number: 1, Textual support number: 1 OBS

sonde logique : terme uniformisé par le Comité du projet de lexiques (Nouveau-Brunswick).  3, fiche 1, Français, - sonde%20logique

Fiche 1,  Justifications,  Espagnol

Record number: 1, Textual support number: 1 DEF

Herramienta de ensayo lógico que provee una lectura directa de los niveles lógicos al conectar o pasar por alto los circuitos integrados.  1, fiche 1, Espagnol, - sondeo%20l%C3%B3gico

Record number: 1, Textual support number: 1 CONT

El sondeo lógico emplea una o varias luces para indicar si la vía de una señal lógica está en el uno lógico o en el cero lógico o cambiando entre estos dos niveles. Algunas unidades utilizan la brillantez relativa para indicar el ciclo activado, otras emplean efectos parpadeantes para indicar la frecuencia.  1, fiche 1, Espagnol, - sondeo%20l%C3%B3gico

Fiche 2,  Justifications,  Anglais

Record number: 2, Textual support number: 1 OBS

Because medium-scale integration(MSI) and large-scale integration(LSI) generally imply digital integrated circuits(ICS), equipment intended to test LSI/MSI devices usually comprises a digital test system. Although manually operated benchtop units are available to test digital logic in a production environment, automated test systems are dictated. Thus, in general, LSI/MSI testers are automated, programmable systems that provide sophisticated test patterns at high repetition rates(usually, rated device operating frequency), with precise edge timing and control of all test parameters. Employed primarily for testing at wafer probe and for final package test(interfaced to a wafer prober or a high-speed, sort devices into predetermined categories based upon test performance, and reject defective devices. A current trend-particularly for semiconductor memories-is to integrate test systems with burn-in systems.  1, fiche 2, Anglais, - LSI%2FMSI%20tester

Fiche 2,  Justifications,  Français

Record number: 2, Textual support number: 1 OBS

LSI signifie «intégration à grande échelle» et MSI «intégration à moyenne échelle.»  1, fiche 2, Français, - appareil%20de%20contr%C3%B4le%20LSI%2FMSI

Fiche 2,  Justifications,  Espagnol