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FACTOR ANALYSIS METHOD [6 records]

Record 1 2009-08-26

English

Subject field(s)
  • Scientific Instruments
CONT

The analytical electron microscope(AEM) is based on a conventional 200 keV transmission electron microscope(TEM) which has been augmented to include the functions of a scanning transmission electron microscope(STEM) and the scanning electron microscope(SEM). Since the electrons must penetrate through the specimen, the specimen dimensions must be no greater than 1 micrometer thick, and preferably in the range of 100 nm. Bulk specimens may be thinned to this range by a combination of mechanical, chemical, and ion sputtering techniques, all of which are available in the microanalysis laboratory. As an imaging tool, the AEM is capable of 0. 3 nm spatial resolution in the TEM mode, 1 nm resolution in the STEM mode, and 3 nm resolution in the SEM mode. Elemental microanalysis is carried out by means of energy dispersive x-ray spectrometry(EDS) and electron energy loss spectrometry(EELS), which together provide sensitivity to all elements with atomic number > 2. Quantitative analysis is carried out by means of a relative sensitivity factor method based on glass, mineral, and metal alloy standards.

French

Domaine(s)
  • Instruments scientifiques
CONT

Le Centre [London Centre for Nanotechnology (ou LCN]), abritera 200 m² de salles blanches ainsi qu'une gamme complète d'outils de caractérisation à l'échelle nanométrique. Un de ces outils sera un puissant microscope électronique analytique (ou AEM pour «Analytical Electron Microscope») d'une résolution de 1,4. Selon «Imperial College», il n'existe que trois microscopes de ce type au monde (Europe et Etats-Unis). Ses capacités d'analyse des matériaux donneront des informations sur la composition locale, les liaisons et l'état électronique des atomes. Les chercheurs du LCN espèrent que cet outil leur permettra de pénétrer les relations complexes qui existent entre l'arrangement atomique d'un matériau et les propriétés et les performances d'un dispositif fabriqué à partir de celui-ci. Les projets de recherche menés grâce à ce microscope concerneront les piles à combustible, les nanostructures magnétiques, les revêtements intelligents, les points quantiques semiconducteurs et la recherche biomédicale.

Spanish

Save record 1

Record 2 2006-03-16

English

Subject field(s)
  • Statistical Methods
  • Personnel and Job Evaluation
CONT

Job Component Method. The job component approach statistically develops a job evaluation method by using multiple factor regression analysis. This analysis identifies the factors and factor weights which best explain the relative market pay levels of benchmark jobs. Regression analysis provides the basis for predicting relationship between two variables.

Key term(s)
  • multiple-factor regression analysis

French

Domaine(s)
  • Méthodes statistiques
  • Évaluation du personnel et des emplois

Spanish

Save record 2

Record 3 2006-03-16

English

Subject field(s)
  • Personnel and Job Evaluation
CONT

The job component method is a statistically developed job evaluation method which relies on scored questionnaires, multiple regression analysis and factor analysis. Employees complete a standardized questionnaire which either identifies the behavioral components of the job or the task based components of the job. The incumbent indicates for each task or behavior, the importance of the category and the frequency of perfomance. The questionnaire is input into a computerized mathematical model and a job score is determined.

French

Domaine(s)
  • Évaluation du personnel et des emplois

Spanish

Save record 3

Record 4 1998-08-04

English

Subject field(s)
  • Statistical Methods
CONT

We applied factor analysis based on the principal component method in the initial solution estimation, and varimax rotation in the final solution derivation.

French

Domaine(s)
  • Méthodes statistiques

Spanish

Save record 4

Record 5 1998-07-17

English

Subject field(s)
  • Personnel and Job Evaluation
Key term(s)
  • factor analysis chart technique

French

Domaine(s)
  • Évaluation du personnel et des emplois

Spanish

Save record 5

Record 6 1998-05-22

English

Subject field(s)
  • Psychometry and Psychotechnology
  • Examinations and Competitions (Education)
  • Educational Psychology
OBS

According to "The Encyclopedia Americana", Louis Thurstone, an American psychologist, "was a pioneer in mental measurement. "He applied the statistical method of factor analysis to the results of intelligence tests and also developed aptitude tests.

French

Domaine(s)
  • Psychométrie et psychotechnique
  • Docimologie
  • Psychologie scolaire
DEF

Méthode proposée par Thurstone pour ordonner des opinions.

Spanish

Save record 6

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