TERMIUM Plus®

The Government of Canada’s terminology and linguistic data bank.

FOCUSSED ION BEAM [4 records]

Record 1 2012-03-06

English

Subject field(s)
  • Scientific Instruments
  • Optical Instruments
DEF

A microscope that is similar to the electron microscope but uses protons instead of electrons as the charged particles.

CONT

The proton-scattering microscope. This instrument uses a beam of protons from an ion source or gun. The beam is focussed and accelerated onto a crystal of a metal such as copper or tungsten, which serves as the target. The pattern of scattered protons is recorded on a fluorescent screen; the blocking patterns provide information on the orientation of the crystals.

French

Domaine(s)
  • Instruments scientifiques
  • Instruments d'optique
DEF

Dispositif d'optique électronique analogue au microscope électronique, mais dans lequel les porteurs électrisés sont des protons.

Spanish

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Record 2 2010-03-08

English

Subject field(s)
  • Scientific Measurements and Analyses
  • Geophysics
  • Radiation Protection
CONT

One application of thermal ionization is thermal ionization mass spectrometry(TIMS). This method is widely used in radiometric dating, where the sample is ionized under vacuum. The ions being produced at the filament are focussed into an ion beam and then passed through a magnetic field to separate them by mass. The relative abundances of different isotopes can then be measured, yielding isotope ratios.

OBS

thermal ionization mass spectrometry (TIMS): term and abbreviation used at Natural Resources Canada - Earth Sciences Sector.

French

Domaine(s)
  • Mesures et analyse (Sciences)
  • Géophysique
  • Radioprotection
OBS

spectrométrie de masse à thermoionisation : terme en usage à Ressources naturelles Canada - Secteur des sciences de la Terre.

Spanish

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Record 3 2006-06-29

English

Subject field(s)
  • Radiological Physics (Theory and Application)
CONT

A Focused Ion Beam (FIB) makes use of Ga-ions to remove material with a very high spatial precision. In this way cross-sections can be made on a specific location. ... When both Ga-ions and certain gases are applied, it is also possible to deposit material. Therefore, the FIB can be used as a multifunctional tool in a broad range of applications.

OBS

A Focussed Ion Beam(FIB) is in many ways similar to a SEM(Scanning Electron Microscope). The main difference is that ions are used, instead of electrons.

OBS

Ga-ion: Gallium ion.

Key term(s)
  • focused ion beam

French

Domaine(s)
  • Physique radiologique et applications
CONT

Le projet NANOFIB met au point une technique de faisceau ionique focalisé. Le diamètre du faisceau est de l'ordre de quelques nanomètres seulement, soit quelques dizaines de diamètres atomiques. [...] Ce procédé de «nanomanipulation», d'une importance cruciale pour l'avenir de la nanofabrication, a pour but de structurer les matériaux à des échelles extrêmement petites.

OBS

NANOFIB: Projet européen de recherche sur les faisceaux ioniques focalisés.

Spanish

Save record 3

Record 4 1996-06-22

English

Subject field(s)
  • Scientific Research Facilities
  • Electromagnetic Radiation
CONT

A focused-ion beam (FIB) nano-fabrication and characterization facility.

Key term(s)
  • focussed ion beam facility
  • focussed-ion beam facility

French

Domaine(s)
  • Installations de recherche scientifique
  • Rayonnements électromagnétiques
OBS

Renseignement obtenu le 90/01/09.

Spanish

Save record 4

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