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Record 1,  Textual support,  English

Record number: 1, Textual support number: 1 CONT

Infrared(IR) microspectroscopy could be defined as the coupling of a microscope to an infrared spectrometer. This coupling allows one to focus IR [infrared] radiation onto the sample, to collect and image transmitted or reflected IR radiation from the sample onto a detector, and to view and position the sample.  3, record 1, English, - infrared%20microspectroscopy

Record 1,  Textual support,  French

Record number: 1, Textual support number: 1 CONT

La spectroscopie infrarouge (IR) est une technique d'analyse couramment utilisée. Elle permet de sonder les vibrations moléculaires d'une large variété d'échantillons, permettant ainsi d'identifier des fonctions chimiques particulières. La spectroscopie IR est souvent couplée à la microscopie optique, on l'appelle alors microspectroscopie infrarouge. Elle permet de réaliser des mesures localisées dans l'espace [...]  1, record 1, French, - microspectroscopie%20infrarouge

Record 1,  Textual support,  Spanish

Record 2,  Textual support,  English

Record number: 2, Textual support number: 1 DEF

A device in which the deflection of a sharp stylus mounted on a soft spring is monitored as the stylus is moved across a surface.  5, record 2, English, - atomic%20force%20microscope

Record number: 2, Textual support number: 1 OBS

Unlike the STM, the AFM [Atomic Force Microscope] can scan nonconducting samples. It can do this because it uses optical technology, direct contact, and a laser, to sense the position of the tip in relation to the sample. The tip is very sharp and protrudes from a small flexible cantilever. The laser reflects off the top side of the tip and is directed to a split photodiode. The height of the surface of the sample deflects the cantilever causing the position of the laser on the photodiode to change. The difference in voltage from the photodiode elements provide a "picture" of the surface.  6, record 2, English, - atomic%20force%20microscope

Record 2,  Textual support,  French

Record number: 2, Textual support number: 1 DEF

Microscope où une pointe très fine se déplaçant à la surface de l'échantillon étudié, enregistre, grâce à un dispositif d'asservissement, la force d'interaction de Van der Waals entre la pointe sondeuse et la surface de l'échantillon.  5, record 2, French, - microscope%20%C3%A0%20forces%20atomiques

Record number: 2, Textual support number: 1 OBS

Le microscope à force atomique est un microscope à palpeur, c'est-à-dire que la sonde est en interaction mécanique (attractive ou répulsive) avec la surface à caractériser.  6, record 2, French, - microscope%20%C3%A0%20forces%20atomiques

Record 2,  Textual support,  Spanish

Record number: 2, Textual support number: 1 DEF

Microscopio de proximidad basado en la detección de la fuerza que actúa entre la punta del microscopio y una [superficie] metálica o aislante [...] monitorea la superficie de la muestra con una punta de radio de curvatura de 20 a 60 nm [nanómetros] que se localiza al final de un cantilever.  1, record 2, Spanish, - microscopio%20de%20fuerza%20at%C3%B3mica

Record number: 2, Textual support number: 1 CONT

El microscopio de fuerzas atómicas […] fue inventado en el año 1986 por G. Binning, C. Quate y Ch. Gerber como un instrumento capaz de obtener con gran resolución imágenes de la topografía de una superficie.  2, record 2, Spanish, - microscopio%20de%20fuerza%20at%C3%B3mica

Record 3,  Textual support,  English

Record number: 3, Textual support number: 1 CONT

The Positron Microscope was designed and built to be a hybrid instrument capable of performing several types of positrons and electron microscopy. For both electrons and positrons the microscope can be run in one of two modes : magnifying mode in which particles leaving the target are focussed onto a CEMA plate assembly to form a magnified image and scanning mode in which the amplitude of a signal is recorded as a function of the position(and possibly energy) of the incident beam. As an electron microscope the instrument will be able to operate in both magnifying and scanning(SEM) modes. As a positron microscope, however, source considerations will limit its immediate use to magnifying mode, i. e. positron reemission microscopy.  2, record 3, English, - positron%20microscope

Record 3,  Textual support,  French

Record number: 3, Textual support number: 1 CONT

De même dans le microscope «positonique», l'image sera formée grâce aux positions qui traversent la matière sans être diffusés par les atomes.  2, record 3, French, - microscope%20positonique

Record 3,  Textual support,  Spanish

Record 4,  Textual support,  English

Record number: 4, Textual support number: 1 DEF

The angle through which a section of a birefringent mineral must be rotated from a known crystallographic plane or direction to the position at which it gives maximum "extinction" or darkness under a polarizing microscope. The extinction angle can be diagnostic in the identification of a particular crystal.  1, record 4, English, - extinction%20angle

Record 4,  Textual support,  French

Record number: 4, Textual support number: 1 CONT

On verra, à propos de chacun des groupes de minéraux des roches, les repères adoptés pour la mesure des "angles d'extinction" (...)  1, record 4, French, - angle%20d%27extinction

Record 4,  Textual support,  Spanish