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ION-MICROPROBE MASS ANALYSIS [1 record]

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Alphabetical list of terms

Record 1 2003-09-08

English

Subject field(s)
  • Analytical Chemistry
DEF

High resolution secondary ion mass spectroscopy (SIMS).

CONT

Post-flight characterization of the samples included (1) metallography, (2) quantitative microstructural analysis, (3) scanning electron microscopy, (4) energy dispersive X-ray analysis, (5) electrical resistivity measurements, (6) X-ray diffraction, (7) chemical analysis, and (8) ion-microprobe mass analysis.

French

Domaine(s)
  • Chimie analytique

Spanish

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