TERMIUM Plus®

The Government of Canada’s terminology and linguistic data bank.

MERCURY PROBE [1 record]

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Record 1 2001-06-12

English

Subject field(s)
  • Printed Circuits and Microelectronics
  • Industrial Techniques and Processes
  • Electrical Measuring Equipment
CONT

Mercury probes are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area. The probes may be connected to C-V plotters, curve tracers, or doping profilers for a variety of measurements. Mercury probes eliminate time consuming metallizations and their convenience make them tools for production process monitoring applications. Mercury probes either contact wafers with a single circular mercury dot contact on the front surface and a large area metal disk for low resistance back contact, or they contact semiconductor wafers with concentric dot and ring mercury electrodes as well as a backside contact.

French

Domaine(s)
  • Circuits imprimés et micro-électronique
  • Techniques industrielles
  • Appareils de mesures (Électricité)

Spanish

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TERMIUM Plus®, the Government of Canada's terminology and linguistic data bank
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