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VAN DER PAUW METHOD [1 record]

Filter results by subject field Alphabetical list of terms

Filter results by subject field

Alphabetical list of terms

Record 1 2007-11-13

English

Subject field(s)
  • Scientific Measurements and Analyses
  • Semiconductors (Electronics)
DEF

The measurement of the resistivity of semiconductor using four probes (contacts) located on its surface ...

OBS

... alternate contacts are used to measure two sets of current-voltage characteristics and then to extract value of resistivity from the formula.

French

Domaine(s)
  • Mesures et analyse (Sciences)
  • Semi-conducteurs (Électronique)
DEF

Mesure de la résistivité d'un semiconducteur faisant appel à quatre sondes (contacts) situées à sa surface et qui assurent en alternance la mesure de deux ensembles de caractéristiques courant-tension pour extraire la valeur de résistivité d'après la formule exploitée.

Spanish

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