TERMIUM Plus®

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WAFER PROBER [1 record]

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Record 1 2001-11-09

English

Subject field(s)
  • Printed Circuits and Microelectronics
CONT

wafer prober. "Cascade Microtech is the acknowledged technology leader for wafer parametric measurement. By combining Cascade's low-noise technology and our advanced production probing capabilities, the EG5300e is unmatched in its ability to make the in-line parametric wafer measurements critical for validating the latest die fabrication processes during production."

French

Domaine(s)
  • Circuits imprimés et micro-électronique

Spanish

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