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SPECTROSCOPIE AUGER [4 records]
Record 1 - internal organization data 2017-02-15
Record 1, English
Record 1, Subject field(s)
- Physics of Solids
- Radiological Physics (Theory and Application)
- Electromagnetic Radiation
Record 1, Main entry term, English
- depth of analysis
1, record 1, English, depth%20of%20analysis
correct
Record 1, Abbreviations, English
Record 1, Synonyms, English
Record 1, Textual support, English
Record number: 1, Textual support number: 1 CONT
Standard AES [Auger Electron Spectroscopy] and XPS [X-ray Photoelectron Spectroscopy] instruments have the ability to sputter argon ions to depth-profile the surfaces of interest, yielding composition as a function of depth. For stainless steel analysis, the total depth of analysis is typically 15 nm [nanometers]. 1, record 1, English, - depth%20of%20analysis
Record 1, French
Record 1, Domaine(s)
- Physique des solides
- Physique radiologique et applications
- Rayonnements électromagnétiques
Record 1, Main entry term, French
- profondeur d’analyse
1, record 1, French, profondeur%20d%26rsquo%3Banalyse
correct, feminine noun
Record 1, Abbreviations, French
Record 1, Synonyms, French
Record 1, Textual support, French
Record number: 1, Textual support number: 1 CONT
Pour mettre en œuvre la spectroscopie Auger induite par des électrons en vue de l'analyse des surfaces solides, il suffit, en principe, de disposer d’une enceinte ultravide équipée d’un canon à électrons et d’un analyseur. Couvrant généralement l'intervalle énergétique de 50 eV [électronvolts] à 2, 5 keV [kiloélectronvolts], le spectre des électrons Auger ainsi obtenu garantit une profondeur d’analyse inférieure à 10 nm [nanomètres] et il s’inscrit sur le fond continu des électrons primaires rétrodiffusés et en amont du spectre des électrons secondaires. 1, record 1, French, - profondeur%20d%26rsquo%3Banalyse
Record 1, Spanish
Record 1, Textual support, Spanish
Record 2 - internal organization data 2003-06-23
Record 2, English
Record 2, Subject field(s)
- Optics
- Chemistry
Record 2, Main entry term, English
- Auger electron spectroscopy
1, record 2, English, Auger%20electron%20spectroscopy
correct
Record 2, Abbreviations, English
- AES 1, record 2, English, AES
correct
- A.E.S. 2, record 2, English, A%2EE%2ES%2E
Record 2, Synonyms, English
- Auger emission spectroscopy 3, record 2, English, Auger%20emission%20spectroscopy
correct
- Auger spectroscopy 4, record 2, English, Auger%20spectroscopy
correct
Record 2, Textual support, English
Record number: 2, Textual support number: 1 DEF
The energy analysis of Auger electrons produced when an excited atom relaxes by a radiationless process after ionization by a high-energy electron, ion, or x-ray beam. 5, record 2, English, - Auger%20electron%20spectroscopy
Record 2, French
Record 2, Domaine(s)
- Optique
- Chimie
Record 2, Main entry term, French
- spectroscopie Auger
1, record 2, French, spectroscopie%20Auger
correct, feminine noun
Record 2, Abbreviations, French
Record 2, Synonyms, French
- spectroscopie des électrons Auger 2, record 2, French, spectroscopie%20des%20%C3%A9lectrons%20Auger
correct, feminine noun
- AES 3, record 2, French, AES
feminine noun
- AES 3, record 2, French, AES
Record 2, Textual support, French
Record number: 2, Textual support number: 1 CONT
Effet Auger : processus d’auto-ionisation d’un atome, au cours duquel un électron excité communique à un autre électron d’une couche externe une énergie suffisante pour l'extraire de l'atome sans émission de proton(processus «non-radioactif»). Cet effet est à l'origine d’une technique de spectroscopie(spectroscopie Auger), importante pour l'étude des surfaces. 4, record 2, French, - spectroscopie%20Auger
Record 2, Spanish
Record 2, Textual support, Spanish
Record 3 - internal organization data 1994-01-27
Record 3, English
Record 3, Subject field(s)
- Analytical Chemistry
Record 3, Main entry term, English
- secondary ion mass spectrometer 1, record 3, English, secondary%20ion%20mass%20spectrometer
Record 3, Abbreviations, English
Record 3, Synonyms, English
Record 3, Textual support, English
Record 3, French
Record 3, Domaine(s)
- Chimie analytique
Record 3, Main entry term, French
- sonde ionique
1, record 3, French, sonde%20ionique
correct, feminine noun
Record 3, Abbreviations, French
Record 3, Synonyms, French
Record 3, Textual support, French
Record number: 3, Textual support number: 1 CONT
Les quadripôles, principalement utilisés pour les analyses de surface, sont en général associés à d’autres techniques d’analyse telles que la spectroscopie Auger dans des enceintes à ultravide et sont souvent appelés SIMS ou sonde ionique. 1, record 3, French, - sonde%20ionique
Record 3, Spanish
Record 3, Textual support, Spanish
Record 4 - internal organization data 1987-09-23
Record 4, English
Record 4, Subject field(s)
- Scientific Measurements and Analyses
- Scientific Research Equipment
Record 4, Main entry term, English
- scanning Auger microscopy 1, record 4, English, scanning%20Auger%20microscopy
Record 4, Abbreviations, English
Record 4, Synonyms, English
Record 4, Textual support, English
Record 4, French
Record 4, Domaine(s)
- Mesures et analyse (Sciences)
- Matériel et équipement (Recherche scientifique)
Record 4, Main entry term, French
- microscopie Auger à balayage
1, record 4, French, microscopie%20Auger%20%C3%A0%20balayage
proposal, feminine noun
Record 4, Abbreviations, French
Record 4, Synonyms, French
Record 4, Textual support, French
Record number: 4, Textual support number: 1 OBS
Par inférence :"microscopie électronique à balayage"(TECHN 1982 E4 et "spectroscopie Auger"(TECHN 1974 P3 2475-8). 1, record 4, French, - microscopie%20Auger%20%C3%A0%20balayage
Record 4, Spanish
Record 4, Textual support, Spanish
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