TERMIUM Plus®
The Government of Canada’s terminology and linguistic data bank.
METHODE ANALYSE DIFFRACTION RAYON-X [1 record]
Record 1 - internal organization data 2003-04-09
Record 1, English
Record 1, Subject field(s)
- Radiological Physics (Theory and Application)
- Scientific Measurements and Analyses
Record 1, Main entry term, English
- X-ray diffraction method
1, record 1, English, X%2Dray%20diffraction%20method
correct
Record 1, Abbreviations, English
Record 1, Synonyms, English
Record 1, Textual support, English
Record number: 1, Textual support number: 1 CONT
X-ray Diffraction Method is an accurate, reliable and time proven tool for residual stress analysis. Using Bragg's law of diffraction the value of surface residual stress can be found by measuring the angle at which an X-ray beam diffracts from the surface of an analyzed component. This measurement method is absolute: i.e. it does not require calibration on samples of known stress levels. 2, record 1, English, - X%2Dray%20diffraction%20method
Record number: 1, Textual support number: 2 CONT
Qualitative and quantitative phase analysis, grain size and micro-stresses determination, macro-stresses measurement using X-ray diffraction method. 3, record 1, English, - X%2Dray%20diffraction%20method
Record 1, Key term(s)
- X-rays diffraction method
- X rays diffraction method
- X ray diffraction method
Record 1, French
Record 1, Domaine(s)
- Physique radiologique et applications
- Mesures et analyse (Sciences)
Record 1, Main entry term, French
- méthode par diffraction des rayons X
1, record 1, French, m%C3%A9thode%20par%20diffraction%20des%20rayons%20X
correct, feminine noun
Record 1, Abbreviations, French
Record 1, Synonyms, French
Record 1, Textual support, French
Record number: 1, Textual support number: 1 CONT
Deux méthodes de diffraction sont les plus utilisées pour déterminer les contraintes résiduelles à la surface des matériaux cristallins : la méthode par diffraction de neutrons et la méthode par diffraction des rayons X, qui fut la première proposée par Lester et Abon au siècle dernier (1925) [...] Le principe est fondé sur la mesure des variations des distances inter-atomiques liées directement à la présence de contraintes résiduelles. L'introduction d'un champ de contraintes résiduelles va se traduire par une déformation du réseau cristallin. En utilisant les plans cristallins comme jauges de déformation, la diffractométrie permet de déterminer de manière non destructive les contraintes en surface dans les matériaux cristallins uniquement [...] 2, record 1, French, - m%C3%A9thode%20par%20diffraction%20des%20rayons%20X
Record 1, Key term(s)
- méthode d'analyse par diffraction des rayons X
- méthode d'analyse par diffraction des rayon-X
- méthode par diffraction des rayons-X
Record 1, Spanish
Record 1, Textual support, Spanish
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