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Record 1,  Textual support,  English

Record number: 1, Textual support number: 1 CONT

In scanning electron microscopy (SEM), a fine probe of electrons with energies typically up to 40 keV [kiloelectron volts] is focused on a specimen, and scanned along a pattern of parallel lines. Various signals are generated as a result of the impact of the incident electrons, which are collected to form an image or to analyse the sample surface. These are mainly secondary electrons, with energies of a few tens of eV [electron volts], high-energy electrons backscattered from the primary beam and characteristic X-rays.  5, record 1, English, - scanning%20electron%20microscopy

Record 1,  Textual support,  French

Record number: 1, Textual support number: 1 CONT

Microscopie électronique à balayage. Les microscopes électroniques à balayage (MEB) utilisent un faisceau d'électrons balayés hautement énergétique pour examiner la surface d'un échantillon.  6, record 1, French, - microscopie%20%C3%A0%20balayage

Record 1,  Textual support,  Spanish

Record number: 1, Textual support number: 1 DEF

Técnica [que] se utiliza para la observación y análisis de superficies suministrando información de relieve, textura, tamaño y forma de grano y composición química [...] de muestras biológicas y minerales.  1, record 1, Spanish, - microscop%C3%ADa%20electr%C3%B3nica%20de%20barrido

Record number: 1, Textual support number: 1 OBS

SEM por sus siglas en inglés.  2, record 1, Spanish, - microscop%C3%ADa%20electr%C3%B3nica%20de%20barrido

Record 2,  Textual support,  English

Record number: 2, Textual support number: 1 CONT

Scanning transmission electron microscopy (STEM) combines the principles of transmission electron microscopy and scanning electron microscopy and can be performed on either type of instrument. Like TEM [transmission electron microscopy], STEM requires very thin samples and looks primarily at beam electrons transmitted by the sample. One of its principal advantages over TEM is in enabling the use of other signals that cannot be spatially correlated in TEM, including secondary electrons, scattered beam electrons, characteristic X-rays, and electron energy loss. Like SEM [scanning electron microscopy], the STEM technique scans a very finely focused beam of electrons across the sample in a raster pattern. Interactions between the beam electrons and sample atoms generate a serial signal stream, which is correlated with beam position to build a virtual image in which the signal level at any location in the sample is represented by the gray level at the corresponding location in the image. Its primary advantage over conventional SEM imaging is the improvement in spatial resolution.  3, record 2, English, - scanning%20transmission%20electron%20microscopy

Record 2,  Textual support,  French

Record number: 2, Textual support number: 1 CONT

Caractérisation des nanomatériaux par microscopie électronique à transmission et à balayage : résolution, analyse X, diffraction électronique, topographie et cartographie.  4, record 2, French, - microscopie%20%C3%A9lectronique%20%C3%A0%20transmission%20et%20%C3%A0%20balayage

Record 2,  Textual support,  Spanish

Record number: 2, Textual support number: 1 CONT

El grupo de investigación [...] ha desarrollado un nuevo método de fabricación de nanoagujas localizadas en el interior de muestras de distintos materiales, que presentan un amplio rango de aplicaciones, como la preparación de muestras para análisis por microscopía electrónica de transmisión (TEM) y transmisión-barrido (STEM), para técnicas de microscopía óptica de barrido de campo cercano, tomografía electrónica y microscopía de sonda atómica.  2, record 2, Spanish, - microscop%C3%ADa%20electr%C3%B3nica%20de%20transmisi%C3%B3n%20y%20barrido

Record number: 2, Textual support number: 1 OBS

STEM: por su sigla en inglés (scanning transmission electron microscopy).  3, record 2, Spanish, - microscop%C3%ADa%20electr%C3%B3nica%20de%20transmisi%C3%B3n%20y%20barrido

Record 3,  Textual support,  French

Record 3,  Textual support,  Spanish

Record 4,  Textual support,  English

Record 4,  Textual support,  French

Record number: 4, Textual support number: 1 OBS

Nicole Guénette (ICC)  1, record 4, French, - laboratoire%20de%20microscopie%20%C3%A9lectronique%20%C3%A0%20balayage

Record 4,  Textual support,  Spanish