TERMIUM Plus®

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TESTEUR TRANCHES [1 record]

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Record 1 2001-11-08

English

Subject field(s)
  • Printed Circuits and Microelectronics
CONT

DELTA's automatic wafer tester. Wafers with microsystems are tested to sort out bad chips before encapsulation. The testing of microsystems is developed based on DELTA's long experience in testing of ICs (integrated circuits). The test can be purely electrical or (soon) with non-electrical stimuli and detection.

French

Domaine(s)
  • Circuits imprimés et micro-électronique
DEF

Appareil généralement piloté par ordinateur et servant à vérifier le bon fonctionnement et les caractéristiques des circuits intégrés.

Spanish

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